APM officially announces the launch of its new All-Silicon Nitride (All-SiN) AFM probe (BC70-GN), developed specifically for high-resolution imaging of soft and delicate materials, including biological samples, polymers, and functional thin films.
Leveraging years of expertise in MEMS manufacturing, APM applies wafer-level microfabrication technology to produce high-quality AFM probes with reliable performance, scalable production capability, and consistent quality. The All-SiN AFM probe (model: BC70-GN) is manufactured in a cleanroom environment using APM’s in-house wafer-level MEMS process, making it well suited for research and industrial applications that require high repeatability and measurement reliability.
The BC70-GN features a low-force architecture, enabling gentle surface interaction while maintaining stable imaging performance and repeatable probe geometry. Typical characteristics include a low spring-constant (~ 0.1 N/m class) cantilever for soft-sample imaging, nanoscale tip (< 40 nm class) geometry for high-resolution surface characterization, and backside gold reflex coating for optical detection compatibility.
Unlike traditional probe suppliers, APM leverages wafer-level MEMS manufacturing capabilities to support scalable production, customization, and long-term supply continuity for AFM OEMs, tool vendors, and industrial customers. APM targets reliable and manufacturable MEMS probe solutions that balance performance with industrial manufacturability and cost efficiency, with strong capability in customized process integration, coatings, and wafer-level structural customization.
APM currently offers evaluation samples and looks forward to collaborating with AFM equipment manufacturers and industrial users, aiming to expand applications in life science imaging, polymer characterization, semiconductor surface analysis, and advanced materials research.
Looking ahead, APM sincerely welcomes inquiries for development projects and collaboration opportunities, and aims to work closely with partners to drive continued innovation and broaden AFM probe applications.
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