APM is pleased to announce the official launch of its AFM probe product line, applying its core MEMS expertise to develop high-quality probes for Atomic Force Microscopes (AFMs).
With years of experience in precision MEMS production, APM brings reliable, scalable probes to meet both standard and advanced application needs. Manufactured on 6-inch equipment in cleanroom conditions, APM probes ensure durability, measurement precision, and consistent cleanliness.
The current product lineup supports general-purpose AFM applications, including surface imaging and mechanical property analysis, with resonance frequency ranging from 70 kHz to 300 kHz. For more demanding applications, such as high-speed scanning or measurements on rigid materials, APM also provides specialized high-frequency probes (~1MHz) designed to deliver enhanced performance and sensitivity.
In addition, APM offers conductive probes optimized for advanced electrical measurement modes such as C-AFM, KPFM, and EFM. To support applications involving delicate samples or liquid-based measurements—such as in biology or electrochemistry, APM is developing soft probes, with trial samples expected to be available later this year.
Currently, APM has established stable partnerships with several leading AFM equipment manufacturers, aiming to elevate the field of microscopic analysis with new technological achievements.
With scalable production capacity and customization support, APM is committed to delivering practical solutions and fostering long-term partnerships with researchers, academic institutions, and industrial users.
Looking ahead, APM sincerely welcomes development inquiries and collaboration opportunities from all sectors to drive innovation and expand possibilities in the AFM field.
To learn more about our APM probe, please visit our product page via the link:
